Sumino, K. (1990). Defect control in semiconductors: Proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st Century Forum, Yokohama, Japan, September 17-22 1989. Amsterdam: North-Holland.
Chicago Style CitationSumino, K. Defect Control in Semiconductors: Proceedings of the International Conference On the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st Century Forum, Yokohama, Japan, September 17-22 1989. Amsterdam: North-Holland, 1990.
MLA CitationSumino, K. Defect Control in Semiconductors: Proceedings of the International Conference On the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st Century Forum, Yokohama, Japan, September 17-22 1989. Amsterdam: North-Holland, 1990.