01073cam a2200241 7i4500 0000007576 20080507090000.0 a20080423 13:59 080422 ne 0444884297 NM NM QC611.6.D4 I583 1990 International Conference on the Science and Technology of Defect Control in Semiconductors, (1989: Yokohama-shi, Japan) Defect control in semiconductors : proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st Century Forum, Yokohama, Japan, September 17-22 1989 edited by K. Sumino. Amsterdam: North-Holland, 1990. 2 v.: ill.; 27cm. Includes bibliographical references and index Materials -- Defects -- Congresses Semiconductors -- Defects -- Congresses Sumino, K. 0000010206 Book Open Shelf HQ Library 0000010207 Book Open Shelf HQ Library