Defect control in semiconductors : proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st Century Forum, Yokohama, Japan, September 17-22 1989

Corporate Author: International Conference on the Science and Technology of Defect Control in Semiconductors, (1989: Yokohama-shi, Japan)
Other Authors: Sumino, K.
Published: Amsterdam: North-Holland, 1990.
Subjects:

HQ Library

Call Number: QC611 6 D4 I583 1990
Accession Item Category Format Status Notes
0000010206 Open Shelf Book AVAILABLE v.1
0000010207 Open Shelf Book AVAILABLE v.2