Main Author:	Hirsch
Language:	English
Published:	Malabar, Florida: Krieger Pub. Co., 1977.
Subjects:	Crystallography Electron microscope Electrons -- > Diffraction

$Topics in electron diffraction and microscopy of materials P. B. Hirsch.$

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Electron microscopy of interfaces in metals and alloys : C. T. Forwood and L. M. Clarebrough.
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$Single crystal diffractometry by U.W. Arndt and B.T.M. Willis.$

Single crystal diffractometry by U.W. Arndt and B.T.M. Willis.
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Using the transmission electron microscope in the biological sciences R. L. Griffin.
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Scanning electron microscopy, x-ray microanalysis, and analytical electron microscopy : a laboratory workbook Charles E. Lyman ... [et al.].

$X-ray diffraction by polycrystalline materials Rene Guinebretiere.$

X-ray diffraction by polycrystalline materials Rene Guinebretiere.
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$Large-angle convergent-beam electron diffraction (LACBED) : applications to crystal defects Jean-Paul Morniroli.$

Large-angle convergent-beam electron diffraction (LACBED) : applications to crystal defects Jean-Paul Morniroli.
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Crystal growth edited by Brian R. Pamplin.
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Crystal-structure analysis Martin J. Buerger.
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Advances in crystal growth : proceedings of the meeting "Italian Crystal Growth", held in Brindisi, Italy, March 15-19, 1995 editors A. M. Mancini, C. Paorici and M. L. Terranova.
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Crystal growth and characterization : proceedings of the ISSCG2 Spring School, Japan, 1974 edited by R. Ueda, J. B. Mullin.
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Single crystal X-ray structural determination : a powerful technique for natural products research and drug discovery H. K. Fun... [et al.].
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$X-ray diffraction by B. E. Warren.$

X-ray diffraction by B. E. Warren.
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$X-ray diffraction methods in polymer science Leroy E. Alexander.$

X-ray diffraction methods in polymer science Leroy E. Alexander.
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Electron microscopy and analysis, 1987 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held at UMIST, 8-9 September 1987 (EMAG 87) edited by L. M. Brown.
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$X-ray diffraction in crystals, imperfect crystals, and amorphous bodies A. Guinier ; translated by Paul Lorrain and Dorothee Sainte-Marie Lorrain.$

X-ray diffraction in crystals, imperfect crystals, and amorphous bodies A. Guinier ; translated by Paul Lorrain and Dorothee Sainte-Marie Lorrain.
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Encyclopedia of scanning electron microscopy edited by Lisa Page.
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The optical microscope in biology Savile Bradbury.
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Optical and electron microscopy in investigation of impeller blade failure Mohd bin Harun et al.
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Interaction of radiation with solids and elementary defect production Chr. Lehmann.
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Proceedings of the Anniversary Adriatico Research Conference on Quasicrystals, ICTP, Trieste, Italy, 4-7 July 1989 editors, Marko V. Jaric, Stig Lundqvist.
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Dislocations in solids edited by F. K. N. Nabarro.
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Interstitial pick-up in some metals and alloys Mohd Harun.
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Clusters and nanomaterials Kawazoe, K. Onho, T. Kondow(eds.).
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Workshop on XRD : instrumentation, technique and applications, 7 June 2001, (MINT), Bangi, Selangor.
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Physical aspects of microscopic characterization of materials : proceedings of the 5th Pfefferkorn Conference, held October 2 to 7, 1986, at Brueggen, West Germany edited by J. Kirschner, K. Murata, J. A. Venables.
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Materials science and technology : a comprehensive treatment: vol. 2. Characterization of materials volume editor, E, Lifshin.
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Analog and digital electronics : a first course Peter H. Beards.
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X-ray crystallography : an introduction to the theory and practice of single-crystal structure analysis G. H. W. Milburn.
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Crystallography : an introduction for earth science and other solid state students by E. J. W. Whittaker.
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Materials science and technology : a comprehensive treatment : vol. 1. Structure of solids volume editor, Volkman Gerold.
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Electronics Roy H. Mattson.
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International tables for x-ray crystallography.
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Electronics : a contemporary approach William H. Gothmann.
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Electronics : a systems approach Neil Storey.
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Electron beam interactions with solids for microscopy, microanalysis & microlithography : proceedings of the 1st Pfefferkorn Conference, held April 18 to 23, 1982, at the Asilomar Conference Center, Monterey, CA edited by David F. Kyser... [et al.] ; managing editor, Daniel Halibey.
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Starting electronics Keith Brindley.
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Characterization of radiation damage by transmission electron microscopy M. L. Jenkins, M. A. Kirk.
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Electronics for technicians P.W. Crane.
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Fundamentals of electronics by F. H. Mitchell.
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Electron microscopy of thin crystals

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