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| LEADER |
00602cam a2200193 7i4500 |
| 001 |
0000002145 |
| 005 |
20070604090000.0 |
| 005 |
20000222000000.0 |
| 008 |
xx 00010 eng |
| 020 |
0 |
0 |
|a 0220662215
|
| 090 |
0 |
0 |
|a TK7871.85
|b .J68 1974
|
| 100 |
1 |
0 |
|a Jowett
|
| 245 |
1 |
0 |
|a Semiconductor devices :
|b testing and evaluation
|c C.E. Jowett.
|
| 260 |
0 |
0 |
|a London:
|b Business Books,
|c 1974.
|
| 300 |
0 |
0 |
|a x, 134 p.:
|b ill.;
|c 24 cm..
|
| 500 |
0 |
0 |
|a Bibliography: p. 125-126
|
| 500 |
0 |
0 |
|a Includes index.
|
| 650 |
0 |
0 |
|a Semiconductors --
|x Testing.
|
| 999 |
|
|
|a 0000001064
|b Book
|c Open Shelf
|e HQ Library
|
