Description: Industrial applications of x-ray diffraction

Other Authors:	Chung,, Smith,
Language:	English
Published:	New York: Marcel Dekker, 2000.
Subjects:	Radiography, Industrial X-rays -- > Diffraction

Physical Description:	xiv,1006p.: ill; 26 cm.
Bibliography:	Includes bibliographical references and index
ISBN:	0824719921 (pbk)