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| LEADER |
00659cam a2200205 7i4500 |
| 001 |
0000003806 |
| 005 |
20080929090000.0 |
| 005 |
20020702000000.0 |
| 008 |
xx 00010 eng |
| 020 |
0 |
0 |
|a 0824789326
|
| 090 |
0 |
0 |
|a TA417.2
|b .S66 1993
|
| 245 |
1 |
0 |
|a Speckle metrology
|c edited by Rajpal S. Sirohi.
|
| 260 |
0 |
0 |
|a New York:
|b Marcel Dekker,
|c 1993.
|
| 300 |
0 |
0 |
|a xiii,551p.:
|b ill.;
|c 24 cm.
|
| 440 |
0 |
0 |
|a Optical engineering;
|v 38
|
| 504 |
0 |
0 |
|a Includes bibliographical references and index
|
| 650 |
0 |
0 |
|a Non-destructive testing
|
| 650 |
0 |
0 |
|a Speckle metrology
|
| 700 |
1 |
1 |
|a Sirohi,
|h Rajpal S.
|
| 999 |
|
|
|a 0000011671
|b Book
|c Open Shelf
|e HQ Library
|
