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Physical aspects of microscopic characterization of materials : proceedings of the 5th Pfefferkorn Conference, held October 2 to 7, 1986, at Brueggen, West Germany

Corporate Author:	Pfefferkorn Conference(
Other Authors:	Kirschner,, Murata,, Venables,
Published:	AMF O'Hare (Chicago), IL: Scanning Microscopy International, 1987.
Series:	Scanning microscopy supplement; v.1, 1987
Subjects:	Solids -- > Congresses Electron beam -- > Congresses Scanning electron microscopes -- > Congresses Electrons -- > Scattering -- > Congresses

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