Description: The Determination of a structure of Pd 80 Si 20 amorphous metal by using x-ray diffraction method.

Main Author:	Abdul Aziz Mohamed
Published:	Bangi: Unit Tenaga Nuklear, 1986.
Subjects:	X-rays -- > Diffraction Silicon alloys

Item Description:	Available in digital version at \\Mes01\atomds\Arkib__BPM\PPA_MINT
Physical Description:	17p.; 28 cm.