Applications of electron microfractography to materials research.

Corporate Authors: Symposium on Applications of Electron Microfractography to Materials Research (1970: Toronto), American Society for Testing and Materials. Subcommittee II on Fractography
Published: Philadelphia: American Society for Testing and Materials, [1971].
Series:ASTM special technique publication; 493
Subjects:
LEADER 00958cam a2200253 7i4500
001 0000007829
005 20080624090000.0
005 0 a20080506 08:19
008 080506 pau
020 0 0 |a LC 70155959  
035 0 |a NM 
040 |a NM 
090 0 0 |a TA460   |b .S913 1970 
111 2 |a Symposium on Applications of Electron Microfractography to Materials Research (1970: Toronto) 
245 1 0 |a Applications of electron microfractography to materials research. 
260 0 0 |a Philadelphia:   |b American Society for Testing and Materials,   |c [1971]. 
300 0 0 |a 96p.:   |b ill.;   |c 23cm. 
440 0 0 |a ASTM special technique publication;   |v 493 
504 0 0 |a Includes bibliographical references 
650 0 0 |a Electron microscopy --   |x Congresses  
650 0 0 |a Fractography --   |x Congresses  
710 2 1 |a American Society for Testing and Materials. Subcommittee II on Fractography  
852 |a NM 
999 |a 0000006848  |b Book  |c Open Shelf  |e HQ Library