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Proceedings of the 16th International Conference on Defects in Semiconductors...

Corporate Author: International Conference on Defects in Semiconductors (16th: 1991: Bethlehem, Pennsylvania)
Other Authors: Davies, Gordon, DeLeo, Gary G., Stavola, Michael
Published: Switzerland: Trans Tech Publications, 1992.
Series:Materials Science Forum; vol. 83-87
Subjects:
Semiconductors -- > Defects -- > Congresses
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HQ Library

Call Number: QC611 6 D4 I58 1992
Accession Item Category Format Status Notes
0000010196 Open Shelf Book AVAILABLE Pt.1
0000010197 Open Shelf Book AVAILABLE Pt.2
0000010198 Open Shelf Book AVAILABLE Pt.3

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