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00811cam a2200205 7i4500 |
| 001 |
0000000590 |
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20070514090000.0 |
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19981126101700.0 |
| 008 |
830712s1983 nyua b 10100 eng |
| 020 |
0 |
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|a 0444008128
|
| 090 |
0 |
0 |
|a QC611.6.D4
|b D425 1983
|
| 245 |
1 |
0 |
|a Defects in semiconductors II :
|b symposium held November 1982 in Boston, Massachusetts, U.S.A.
|c editors, Subhash Mahajan, James W. Corbett.
|
| 260 |
0 |
0 |
|a New York:
|b North-Holland,
|c 1983..
|
| 300 |
|
|
|a xv, 582 p.:
|b ill.;
|c 24 cm..
|
| 490 |
0 |
0 |
|a Materials Research Society symposia proceedings;
|v v. 14
|
| 504 |
0 |
0 |
|a Includes bibliographical references and index
|
| 650 |
0 |
0 |
|a Semiconductors --
|x Defects --
|x Congresses.
|
| 700 |
1 |
1 |
|a Mahajan,
|h Subhash.
|
| 700 |
1 |
1 |
|a Corbett,
|h James W.
|
| 999 |
|
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|a 0000009045
|b Book
|c Open Shelf
|e HQ Library
|