The physics of SiO2 and its interfaces : proceedings of the International Topical Conference on the Physics of SiO2 and Its Interfaces held at the IBM Thomas J. Watson Research Center Yorktown Heights, New York, March 22-24 1978
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| Published: |
New York:
Pergamon Press,
1978.
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| Subjects: |
HQ Library
| Call Number: |
QC585 75 S55 I57 1978 |
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| Accession | Item Category | Format | Status | Notes |
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| 0000005688 | Open Shelf | Book | AVAILABLE |