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The physics of SiO2 and its interfaces : proceedings of the International Topical Conference on the Physics of SiO2 and Its Interfaces held at the IBM Thomas J. Watson Research Center Yorktown Heights, New York, March 22-24 1978

Corporate Author:	International Topical Conference on the Physics SiO2 and its Interfaces(
Other Authors:	Pantelides,
Published:	New York: Pergamon Press, 1978.
Subjects:	Surface chemistry -- > Congresses Surfaces (Physics) -- > Congresses Silica -- > Congresses

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