The physics of SiO2 and its interfaces : proceedings of the International Topical Conference on the Physics of SiO2 and Its Interfaces held at the IBM Thomas J. Watson Research Center Yorktown Heights, New York, March 22-24 1978

Corporate Author: International Topical Conference on the Physics SiO2 and its Interfaces(
Other Authors: Pantelides,
Published: New York: Pergamon Press, 1978.
Subjects:
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020 0 0 |a 0080230490  
090 0 0 |a QC585.75.S55   |b I57 1978 
110 1 0 |a International Topical Conference on the Physics SiO2 and its Interfaces(  |i Yorktown Heights, New York) 
245 1 4 |a The physics of SiO2 and its interfaces :   |b proceedings of the International Topical Conference on the Physics of SiO2 and Its Interfaces held at the IBM Thomas J. Watson Research Center Yorktown Heights, New York, March 22-24 1978   |c editor, Sokrates T. Pantelides. 
260 0 0 |a New York:   |b Pergamon Press,   |c 1978. 
300 |a xi,488 p.:   |b ill.;   |c 27 cm. 
504 0 0 |a Includes bibliographical references and index 
650 0 0 |a Surface chemistry --   |x Congresses  
650 0 0 |a Surfaces (Physics) --   |x Congresses  
650 0 0 |a Silica --   |x Congresses  
700 1 1 |a Pantelides,   |h Sokrates T.  
999 |a 0000005688  |b Book  |c Open Shelf  |e HQ Library